A – Lecture notes on EXAFS
- Introduction
- Photoelectric absorption of X-rays
- Origin of EXAFS
- Interpretation of EXAFS
- Experimental techniques
- EXAFS analysis
- XANES
- Appendices
Revised 16 March 2023
B – Lecture notes on Physics of Matter
- Introduction
- Real-space structure
- Reciprocal space
- Symmetry in molecules and crystals
- Representations of symmetry groups
- The origin of structures
- Vibrational dynamics
- Vibrational thermal properties
- Ground-state electronic properties of crystals
- Electron thermal and transport properties
- Structural probes
Revised 30 March 2023
C – Basic Crystallography (slides)
- X-rays and materials structure
- Crystal lattices and cells
- Symmetry classifications
- Some relevant crystal structures
- Close packing
D – X-ray and neutron sources (slides)
- Mechanisms of X-ray production
- Laboratory X-ray sources
- Synchrotron Radiation (storage rings, bending magnets, insertion devices)
- Neutron sources
E1 – X-ray elastic scattering from atoms (slides)
- Structural probes: X-rays, neutron, electrons
- Basics of scattering
- X-ray Thomson scattering
- Interference
- Deviations from classical treatment (electron distribution, Compton effect, electron binding)
- Neutron and electron scattering
E2 – X-ray scattering from molecules and non-crystalline matter (slides)
- Atomic aggregates
- X-ray scattering from molecules, Debye formula
- X-ray scattering from non-crystalline materials
E3 – X-ray scattering from crystals (“diffraction”) (slides)
- X-ray scattering from crystals
- Diffraction conditions
- Experimental methods
- The structure factor
- The phase problem
- Thermal effects
- Synchrotron Radiation and diffraction
- Neutron scattering
E4 – X-ray scattering: quantum approach (slides)
- Scattering cross-section
- Two-photon processes: scattering
- X-ray scattering, elsatic and inelastic
- Static and dynamic scattering functions
- Effects of atomic vibrations on diffraction patterns
- Scattering by crystal phonons, theory and experiments
Books
P. Fornasini: The Uncertainty in Physical Measurements, Springer, NY, 2008